<p>SEM-EDX is a combined analysis technique that uses a&nbsp;<strong class="Yjhzub" data-processed="true"><a class="GI370e" href="https://www.google.com/search?q=Scanning+Electron+Microscope&amp;sca_esv=93999e5bd7a9b6bb&amp;ei=J6nsaOHvE6jE4-EPmajs-Qo&amp;oq=SEM-EDX&amp;gs_lp=Egxnd3Mtd2l6LXNlcnAiB1NFTS1FRFgqAggAMgUQABiABDILEAAYgAQYkQIYigUyCxAAGIAEGJECGIoFMgsQABiABBiRAhiKBTILEAAYgAQYkQIYigUyBRAAGIAEMgUQABiABDIFEAAYgAQyBBAAGB4yBBAAGB5ImDpQhAVY6yVwAngBkAEDmAGOAaAB4AyqAQQwLjE0uAEByAEA-AEBmAIKoAKECKgCFMICChAAGLADGNYEGEfCAg0QABiABBiwAxhDGIoFwgIKEAAYgAQYQxiKBcICExAAGIAEGEMYtAIYigUY6gLYAQHCAhAQABgDGLQCGOoCGI8B2AECwgIQEC4YgAQY0QMYQxjHARiKBcICCBAAGIAEGLEDwgIFEC4YgATCAg4QLhiABBixAxjRAxjHAcICDhAAGIAEGLEDGIMBGIoFwgIIEC4YgAQYsQPCAgsQABiABBixAxiDAcICDRAAGIAEGLEDGEMYigXCAhEQLhiABBixAxjRAxiDARjHAZgDBvEFadk2cex7YFqIBgGQBgq6BgQIARgHugYGCAIQARgKkgcDMi44oAfOZbIHAzAuOLgH-wfCBwUwLjIuOMgHLA&amp;sclient=gws-wiz-serp&amp;mstk=AUtExfA2MW7HwlgvAliocAJ1ftFtZQGobq8KccXExUPa6VId0kWTMJP3CiS3tQBalZvjHyRvK4ssY9UVHb_7wGhCn8cG9VSPF5MNoic12QCy6rKpKiAboA0ZOXRLFj8q8xsZ0j4&amp;csui=3&amp;ved=2ahUKEwi1iPCe06CQAxUyy6ACHRSFJz0QgK4QegQIARAD" data-wiz-uids="MSM2Ld_k" data-ved="2ahUKEwi1iPCe06CQAxUyy6ACHRSFJz0QgK4QegQIARAD" data-hveid="CAEQAw" data-processed="true">Scanning Electron Microscope</a>&nbsp;(SEM)</strong>&nbsp;to generate high-resolution images of a sample's surface and an&nbsp;<strong class="Yjhzub" data-processed="true">Energy Dispersive X-ray Spectroscopy (EDX)</strong>&nbsp;detector to simultaneously analyze its elemental composition. This allows for the simultaneous examination of both the sample's morphology and its chemical makeup, providing a comprehensive view of its structure and composition from a single analysis.<span class="uJ19be notranslate" data-wiz-uids="MSM2Ld_m,MSM2Ld_n" data-processed="true"><span class="vKEkVd" data-animation-atomic="" data-processed="true">&nbsp;</span></span></p><br/><div class="otQkpb" role="heading" aria-level="3" data-sfc-cp="" data-processed="true"><strong>Applications:</strong></div><br/><ul class="KsbFXc U6u95" data-processed="true"><br/><li data-hveid="CAUQAA" data-processed="true"><span class="T286Pc" data-sfc-cp="" data-processed="true"><strong class="Yjhzub" data-processed="true">Materials science:</strong>&nbsp;Analyzing the composition of materials, identifying contaminants, or examining fracture surfaces.</span></li><br/><li data-hveid="CAUQAQ" data-processed="true"><span class="T286Pc" data-sfc-cp="" data-processed="true"><strong class="Yjhzub" data-processed="true">Forensic science:</strong>&nbsp;Classifying and discriminating evidence material by comparing morphology and elemental composition.</span></li><br/><li data-hveid="CAUQAg" data-processed="true"><span class="T286Pc" data-sfc-cp="" data-processed="true"><strong class="Yjhzub" data-processed="true">Quality control and failure analysis:</strong> Detecting defects, cracks, or layers in materials.</span></li><br/></ul>